1) Light-induced defects in semiconductors

Author
Morigaki, Kazuo
Publisher
Pan Stanford Publishing
Pub. Date
2015.
Language
English

2) Defects and diffusion in semiconductors XIII

Series
Diffusion and defect data. Pt. A Defect and diffusion forum volume 318
Publisher
Trans Tech Publications Ltd
Pub. Date
[2011]
Language
English

3) Defects and diffusion, theory and simulation: an annual retrospective II

Series
Diffusion and defect data. Pt. A Defect and diffusion forum volume 307
Publisher
Trans Tech Publications
Pub. Date
[2010]
Language
English

4) Defects and diffusion in semiconductors: XIV

Series
Diffusion and defect data. Pt. A Defect and diffusion forum volume 332
Publisher
Trans Tech Publications
Pub. Date
[2013]
Language
English

5) Defects and diffusion, theory and simulation: an annual retrospective I

Series
Diffusion and defect data. Pt. A Defect and diffusion forum volume 307
Publisher
Trans Tech Publications
Pub. Date
2009.
Language
English

6) Defects and diffusion in semiconductors: an annual retrospective /XI

Series
Diffusion and defect data. Pt. A Defect and diffusion forum volume 282
Publisher
TTP, Trans Tech Publications
Pub. Date
[2008]
Language
English

8) Metal impurities in silicon-device fabrication

Author
Graff, Klaus
Series
Springer series in materials science volume 24
Publisher
Springer
Pub. Date
1995.
Language
English

9) Microelectronics failure analysis: desk reference

Publisher
ASM International
Pub. Date
c2011
Language
English

10) Transient-induced latchup in CMOS integrated circuits

Author
Ker, Ming-Dou
Publisher
Wiley
Pub. Date
c2009
Language
English