Characterization of high Tc materials and devices by electron microscopy
(eBook)

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Published
Cambridge ; New York : Cambridge University Press, 2000.
Physical Desc
xii, 391 pages : ill.
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Format
eBook
Language
English

Notes

Bibliography
Includes bibliographical references.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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Citations

APA Citation, 7th Edition (style guide)

Browning, N. D., & Pennycook, S. J. (2000). Characterization of high Tc materials and devices by electron microscopy . Cambridge University Press.

Chicago / Turabian - Author Date Citation, 17th Edition (style guide)

Browning, Nigel D and Stephen J. Pennycook. 2000. Characterization of High Tc Materials and Devices By Electron Microscopy. Cambridge University Press.

Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)

Browning, Nigel D and Stephen J. Pennycook. Characterization of High Tc Materials and Devices By Electron Microscopy Cambridge University Press, 2000.

MLA Citation, 9th Edition (style guide)

Browning, Nigel D., and Stephen J Pennycook. Characterization of High Tc Materials and Devices By Electron Microscopy Cambridge University Press, 2000.

Note! Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy. Citation formats are based on standards as of August 2021.

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Grouped Work ID
dbac3bab-c06b-cf45-a131-1b78a30829c6-eng
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Grouping Information

Grouped Work IDdbac3bab-c06b-cf45-a131-1b78a30829c6-eng
Full titlecharacterization of high tc materials and devices
Authornigel d browning stephen j pennycook
Grouping Categorybook
Last Update2022-06-07 21:23:19PM
Last Indexed2024-05-30 05:24:29AM

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First LoadedMay 5, 2023
Last UsedDec 4, 2023

Marc Record

First DetectedAug 09, 2021 11:54:30 AM
Last File Modification TimeNov 22, 2021 07:34:30 AM

MARC Record

LEADER01799nam a22004094a 4500
001EBC201990
003MiAaPQ
006m    E |      
007cr cn|||||||||
008990128s2000    enka    sb    000 0 eng  
010 |z  99018754
020 |z 052155490X (hb)
035 |a (Sirsi) EBC201990
035 |a (Sirsi) EBC201990
035 |a (MiAaPQ)EBC201990
035 |a (Au-PeEL)EBL201990
035 |a (CaPaEBR)ebr10065742
035 |a (CaONFJC)MIL41701
035 |a (OCoLC)228069387
040 |a MiAaPQ|c MiAaPQ|d MiAaPQ
050 4|a QC611.98.H54|b C43 2000
08204|a 537.6/23/0284|2 21
24500|a Characterization of high Tc materials and devices by electron microscopy|h [eBook] /|c edited by Nigel D. Browning, Stephen J. Pennycook.
260 |a Cambridge ;|a New York :|b Cambridge University Press,|c 2000.
300 |a xii, 391 p. :|b ill.
504 |a Includes bibliographical references.
533 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0|a High temperature superconductors.
650 0|a Electron microscopy|x Technique.
655 4|a Electronic books.
7001 |a Browning, Nigel D.
7001 |a Pennycook, Stephen J.
7102 |a ProQuest (Firm)
85640|u http://ebookcentral.proquest.com/lib/yavapai-ebooks/detail.action?docID=201990|x Yavapai College|y Yavapai College users click here to access
85640|u http://ebookcentral.proquest.com/lib/prescottcollege-ebooks/detail.action?docID=201990|x Prescott College|y Prescott College users click here to access
85640|u http://ebookcentral.proquest.com/lib/yln-ebooks/detail.action?docID=201990|x Yavapai Library Network|y All other users click here to access
945 |a E-Book