Design for at-speed test, diagnosis, and measurement
(eBook)
Contributors
Published
Boston : Kluwer Academic, c2000.
Physical Desc
xvii, 239 pages : ill.
Status
More Details
Format
eBook
Language
English
Notes
Bibliography
Includes bibliographical references.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
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Citations
APA Citation, 7th Edition (style guide)
Nadeau-Dostie, B. (2000). Design for at-speed test, diagnosis, and measurement . Kluwer Academic.
Chicago / Turabian - Author Date Citation, 17th Edition (style guide)Nadeau-Dostie, Benoit. 2000. Design for At-speed Test, Diagnosis, and Measurement. Kluwer Academic.
Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)Nadeau-Dostie, Benoit. Design for At-speed Test, Diagnosis, and Measurement Kluwer Academic, 2000.
MLA Citation, 9th Edition (style guide)Nadeau-Dostie, Benoit. Design for At-speed Test, Diagnosis, and Measurement Kluwer Academic, 2000.
Note! Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy. Citation formats are based on standards as of August 2021.
Staff View
Grouped Work ID
16494fcc-faf3-022b-5a16-6852d2fc1262-eng
Grouping Information
| Grouped Work ID | 16494fcc-faf3-022b-5a16-6852d2fc1262-eng |
|---|---|
| Full title | design for at speed test diagnosis and measurement |
| Author | benoit nadeau dostie |
| Grouping Category | book |
| Last Update | 2022-06-07 21:23:19PM |
| Last Indexed | 2024-05-04 02:41:16AM |
Book Cover Information
| Image Source | default |
|---|---|
| First Loaded | Jan 10, 2023 |
| Last Used | May 6, 2024 |
Marc Record
| First Detected | Aug 09, 2021 12:41:53 PM |
|---|---|
| Last File Modification Time | Nov 22, 2021 09:06:04 AM |
MARC Record
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| 050 | 4 | |a TK7874|b .D47497 2000 | |
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| 245 | 0 | 0 | |a Design for at-speed test, diagnosis, and measurement|h [eBook] /|c edited by Benoit Nadeau-Dostie. |
| 260 | |a Boston :|b Kluwer Academic,|c c2000. | ||
| 300 | |a xvii, 239 p. :|b ill. | ||
| 490 | 1 | |a Frontiers in electronic testing | |
| 504 | |a Includes bibliographical references. | ||
| 533 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Integrated circuits|x Testing. | |
| 650 | 0 | |a Electronic apparatus and appliances|x Testing. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Nadeau-Dostie, Benoit. | |
| 710 | 2 | |a ProQuest (Firm) | |
| 830 | 0 | |a Frontiers in electronic testing. | |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/yavapai-ebooks/detail.action?docID=3035636|x Yavapai College|y Yavapai College users click here to access |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/prescottcollege-ebooks/detail.action?docID=3035636|x Prescott College|y Prescott College users click here to access |
| 856 | 4 | 0 | |u http://ebookcentral.proquest.com/lib/yln-ebooks/detail.action?docID=3035636|x Yavapai Library Network|y All other users click here to access |
| 945 | |a E-Book | ||
