Fault injection techniques and tools for embedded systems reliability evaluation
(eBook)

Book Cover
Average Rating
Published
Boston : Kluwer Academic Publishers, c2003.
Physical Desc
xiv, 241 pages : ill.
Status

More Details

Format
eBook
Language
English

Notes

Bibliography
Includes bibliographical references (p. [231]-241).
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

Description

Loading Description...

Also in this Series

Checking series information...

More Like This

Loading more titles like this title...

Reading Recommendations & More

Citations

APA Citation, 7th Edition (style guide)

Benso, A., & Prinetto, P. (2003). Fault injection techniques and tools for embedded systems reliability evaluation . Kluwer Academic Publishers.

Chicago / Turabian - Author Date Citation, 17th Edition (style guide)

Benso, Alfredo and Paolo. Prinetto. 2003. Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation. Kluwer Academic Publishers.

Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)

Benso, Alfredo and Paolo. Prinetto. Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation Kluwer Academic Publishers, 2003.

MLA Citation, 9th Edition (style guide)

Benso, Alfredo., and Paolo Prinetto. Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation Kluwer Academic Publishers, 2003.

Note! Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy. Citation formats are based on standards as of August 2021.

Staff View

Grouped Work ID
6838c344-30ed-45ce-bfe2-c51dd88f3bc8-eng
Go To Grouped Work

Grouping Information

Grouped Work ID6838c344-30ed-45ce-bfe2-c51dd88f3bc8-eng
Full titlefault injection techniques and tools for embedded systems reliability evaluation
Authoralfredo benso and paolo prinetto
Grouping Categorybook
Last Update2022-06-07 21:23:19PM
Last Indexed2024-05-04 04:13:11AM

Book Cover Information

Image Sourcedefault
First LoadedFeb 16, 2023
Last UsedMay 7, 2024

Marc Record

First DetectedAug 09, 2021 12:41:55 PM
Last File Modification TimeNov 22, 2021 09:06:08 AM

MARC Record

LEADER01933nam a2200433Ia 4500
001EBC3036042
003MiAaPQ
006m    E |      
007cr cn|||||||||
008030814s2003    maua    sb    000 0 eng d
010 |z  2003061871
020 |z 1402075898 (alk. paper)
035 |a (Sirsi) EBC3036042
035 |a (Sirsi) EBC3036042
035 |a (MiAaPQ)EBC3036042
035 |a (Au-PeEL)EBL3036042
035 |a (CaPaEBR)ebr10078628
035 |a (OCoLC)923697010
040 |a MiAaPQ|c MiAaPQ|d MiAaPQ
050 4|a TK7895.E42|b F38 2003
08204|a 004.2/56|2 22
24500|a Fault injection techniques and tools for embedded systems reliability evaluation|h [eBook] /|c edited by Alfredo Benso and Paolo Prinetto.
260 |a Boston :|b Kluwer Academic Publishers,|c c2003.
300 |a xiv, 241 p. :|b ill.
4901 |a Frontiers in electronic testing ;|v 23
504 |a Includes bibliographical references (p. [231]-241).
533 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0|a Embedded computer systems|x Testing.
650 0|a Embedded computer systems|x Reliability.
650 0|a Fault location (Engineering)
655 4|a Electronic books.
7001 |a Benso, Alfredo.
7001 |a Prinetto, Paolo.
7102 |a ProQuest (Firm)
830 0|a Frontiers in electronic testing ;|v 23.
85640|u http://ebookcentral.proquest.com/lib/yavapai-ebooks/detail.action?docID=3036042|x Yavapai College|y Yavapai College users click here to access
85640|u http://ebookcentral.proquest.com/lib/prescottcollege-ebooks/detail.action?docID=3036042|x Prescott College|y Prescott College users click here to access
85640|u http://ebookcentral.proquest.com/lib/yln-ebooks/detail.action?docID=3036042|x Yavapai Library Network|y All other users click here to access
945 |a E-Book