On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond
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Rumiantsev, A. (2019). On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond . River Publishers.
Chicago / Turabian - Author Date Citation, 17th Edition (style guide)Rumiantsev, Andrej. 2019. On-Wafer Calibration Techniques Enabling Accurate Characterization of High-performance Silicon Devices At the Mm-wave Range and Beyond. River Publishers.
Chicago / Turabian - Humanities (Notes and Bibliography) Citation, 17th Edition (style guide)Rumiantsev, Andrej. On-Wafer Calibration Techniques Enabling Accurate Characterization of High-performance Silicon Devices At the Mm-wave Range and Beyond River Publishers, 2019.
MLA Citation, 9th Edition (style guide)Rumiantsev, Andrej. On-Wafer Calibration Techniques Enabling Accurate Characterization of High-performance Silicon Devices At the Mm-wave Range and Beyond River Publishers, 2019.
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Grouping Information
Grouped Work ID | 4838e93c-a929-298d-8907-5c3cb0c58500-eng |
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Full title | on wafer calibration techniques enabling accurate characterization of high performance silicon devices at the mm wave range and beyond |
Author | rumiantsev andrej |
Grouping Category | book |
Last Update | 2022-06-07 21:23:19PM |
Last Indexed | 2024-05-21 03:23:36AM |
Book Cover Information
Image Source | syndetics |
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First Loaded | Jul 5, 2022 |
Last Used | May 15, 2024 |
Marc Record
First Detected | Aug 09, 2021 02:12:33 PM |
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Last File Modification Time | Nov 22, 2021 10:23:36 AM |
MARC Record
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